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Temperature dependence of the threshold current of QW lasers
Temperature dependence of the threshold current of QW lasers

Optimization of parameters of a structured semiconductor microchannel and  those of increasing single-electron pulse level
Optimization of parameters of a structured semiconductor microchannel and those of increasing single-electron pulse level

REVIEW Chalcogenide passivation of III–V semiconductor surfaces
REVIEW Chalcogenide passivation of III–V semiconductor surfaces

The calculated Ioffe-Regel critical density of Si- MOSFET as a function...  | Download Scientific Diagram
The calculated Ioffe-Regel critical density of Si- MOSFET as a function... | Download Scientific Diagram

ECE 4570 Electronic Device Fundamentals
ECE 4570 Electronic Device Fundamentals

SpecialIssue
SpecialIssue

MRS Internet Journal Research Nitride Semiconductor
MRS Internet Journal Research Nitride Semiconductor

A. F. Ioffe Semiconductor Thermoelements And Thermoelectric Cooling  Infosearch ( 1957)
A. F. Ioffe Semiconductor Thermoelements And Thermoelectric Cooling Infosearch ( 1957)

Director of Ioffe Institute: “Science сannot exist in isolation”
Director of Ioffe Institute: “Science сannot exist in isolation”

ATE Central - Semiconductors on NSM
ATE Central - Semiconductors on NSM

Development of detectors based on binary semiconductors in Ioffe  Physico-Technical Institute
Development of detectors based on binary semiconductors in Ioffe Physico-Technical Institute

Semiconductor Parameters | PDF | Band Gap | Electrical Resistivity And  Conductivity
Semiconductor Parameters | PDF | Band Gap | Electrical Resistivity And Conductivity

Band structure and carrier concentration of Indium Arsenide (InAs)
Band structure and carrier concentration of Indium Arsenide (InAs)

Characterization of the time-frequency parameters inherent in the radiation  of semiconductor heterolasers using interferometric
Characterization of the time-frequency parameters inherent in the radiation of semiconductor heterolasers using interferometric

Handbook Series on Semiconductor Parameters : ALUMINIUM GALLIUM ARSENIDE
Handbook Series on Semiconductor Parameters : ALUMINIUM GALLIUM ARSENIDE

Effect of uniaxial deformation on electrophysical parameters of 6<Emphasis  Type="Italic">H</Emphasis>-SiC
Effect of uniaxial deformation on electrophysical parameters of 6<Emphasis Type="Italic">H</Emphasis>-SiC

Heterojunctions based on Silicon Carbide
Heterojunctions based on Silicon Carbide

SEMICONDUCTORS AND DIELECTRICS
SEMICONDUCTORS AND DIELECTRICS

A. F. Ioffe Semiconductor Thermoelements And Thermoelectric Cooling  Infosearch ( 1957)
A. F. Ioffe Semiconductor Thermoelements And Thermoelectric Cooling Infosearch ( 1957)

NSM Archive - Band structure and carrier concentration of Silicon (Si)
NSM Archive - Band structure and carrier concentration of Silicon (Si)

ATE Central - Semiconductors on NSM
ATE Central - Semiconductors on NSM

Handbook Series on Semiconductor Parameters : SILICON
Handbook Series on Semiconductor Parameters : SILICON

Interface-induced lateral anisotropy of semiconductor heterostructures M.O.  Nestoklon, Ioffe Physico-Technical Institute, St. Petersburg, Russia JASS  ppt download
Interface-induced lateral anisotropy of semiconductor heterostructures M.O. Nestoklon, Ioffe Physico-Technical Institute, St. Petersburg, Russia JASS ppt download

Semiconductor Parameters | PDF | Band Gap | Electrical Resistivity And  Conductivity
Semiconductor Parameters | PDF | Band Gap | Electrical Resistivity And Conductivity

Handbook Series on Semiconductor Parameters
Handbook Series on Semiconductor Parameters

New Semiconductor Materials. Characteristics and Properties
New Semiconductor Materials. Characteristics and Properties

PDF) Energy Storage Capacitor Cell with Semiconductor Switches
PDF) Energy Storage Capacitor Cell with Semiconductor Switches

On the Band Structure of Ultrathin Layer Semiconductor Superlattices
On the Band Structure of Ultrathin Layer Semiconductor Superlattices

Ioffe-Regel criterion of Anderson localization in the model of resonant  point scatterers – arXiv Vanity
Ioffe-Regel criterion of Anderson localization in the model of resonant point scatterers – arXiv Vanity